AIP Advances (Jun 2015)

Low-reflection beam refractions by ultrathin Huygens metasurface

  • Sheng Li Jia,
  • Xiang Wan,
  • Xiao Jian Fu,
  • Yong Jiu Zhao,
  • Tie Jun Cui

DOI
https://doi.org/10.1063/1.4922062
Journal volume & issue
Vol. 5, no. 6
pp. 067102 – 067102-8

Abstract

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We propose a Huygens source unit cell to develop an ultrathin low-reflection metasurface, which could provide extreme controls of phases of the transmitted waves. Both electric and magnetic currents are supported by the proposed unit cell, thus leading to highly efficient and full controls of phases. The coupling between electric and magnetic responses is negligible, which will significantly reduce the difficulty of design. Since the unit cell of metasurface is printed on two bonded boards, the fabrication process is simplified and the thickness of metasurface is reduced. Based on the proposed unit cell, a beam-refracting metasurface with low-reflection is designed and manufactured. Both near-field and far-field characteristics of the beam-refracting metasurface are investigated by simulations and measurements, which indicate that the proposed Huygens metasurface performs well in controlling electromagnetic waves.