Applied Sciences (Nov 2023)

Enhancing Anomaly Detection Models for Industrial Applications through SVM-Based False Positive Classification

  • Ji Qiu,
  • Hongmei Shi,
  • Yuhen Hu,
  • Zujun Yu

DOI
https://doi.org/10.3390/app132312655
Journal volume & issue
Vol. 13, no. 23
p. 12655

Abstract

Read online

Unsupervised anomaly detection models are crucial for the efficiency of industrial applications. However, frequent false alarms hinder the widespread adoption of unsupervised anomaly detection, especially in fault detection tasks. To this end, our research delves into the dependence of false alarms on the baseline anomaly detector by analyzing the high-response regions in anomaly maps. We introduce an SVM-based false positive classifier as a post-processing module, which identifies false alarms from positive predictions at the object level. Moreover, we devise a sample synthesis strategy that generates synthetic false positives from the trained baseline detector while producing synthetic defect patch features from fuzzy domain knowledge. Following comprehensive evaluations, we showcase substantial performance enhancements in two advanced out-of-distribution anomaly detection models, Cflow and Fastflow, across image and pixel-level anomaly detection performance metrics. Substantive improvements are observed in two distinct industrial applications, with notable instances of elevating the image-level F1-score from 46.15% to 78.26% in optimal scenarios and boosting pixel-level AUROC from 72.36% to 94.74%.

Keywords