High-speed wavefront determination method based on single in-and-out electric field analysis to focus light through highly scattering medium
Jing Cao,
Qiang Yang,
Yusi Miao,
Yan Li,
Pinghe Wang,
Zhongping Chen
Affiliations
Jing Cao
Beckman Laser Institute, University of California Irvine, Irvine, California 92612, USA
Qiang Yang
Beckman Laser Institute, University of California Irvine, Irvine, California 92612, USA
Yusi Miao
Beckman Laser Institute, University of California Irvine, Irvine, California 92612, USA
Yan Li
Beckman Laser Institute, University of California Irvine, Irvine, California 92612, USA
Pinghe Wang
China State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu 610054, China
Zhongping Chen
Beckman Laser Institute, University of California Irvine, Irvine, California 92612, USA
We develop a new type of high-speed wavefront determination method with single feedback measurement to focus light through a 15.2 scattering mean free path in ∼113 ms. Our method is based on a heterodyne-detection phase sensitivity interferometer. First, the matrix which describes the light propagation process in the sample is measured by single input and output optical fields’ analysis. Then, by using a spatial light modulator to reshape the incident light with a matched wavefront, a focused beam is observed behind the sample. The proposed high-speed light focusing method will open new spot scanning mode toward deeper imaging through highly scattering biological tissues.