The study of charge injection mechanism of C60/CuPc organic heterojunction connector layer

Abstract

The charge injection mechanism of a connector layer is one of the critical issues influencing the performance of tandem organic light-emitting diodes (OLEDs). In this paper, to explore the charge injection mechanism of an organic heterojunction connector (OHJC) layer, we studied the device current density (J) characteristics generated by the C60/CuPc OHJC layer under different applied voltages (V). By analyzing the log(J)–V1/2 and ln(J/E)–1/E2 characteristics of devices, we found that the charge injection mechanism of the C60/CuPc OHJC layer is in accordance with the Richardson–Schottky model. This study can be a theoretical basis to design high-efficiency OLEDs.