Metrology and Measurement Systems (Sep 2015)

The Analysis Of Accuracy Of Selected Methods Of Measuring The Thermal Resistance Of IGBTs

  • Górecki Krzysztof,
  • Górecki Paweł

DOI
https://doi.org/10.1515/mms-2015-0036
Journal volume & issue
Vol. 22, no. 3
pp. 455 – 464

Abstract

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In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.

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