Research on WPD and DBSCAN-L-ISOMAP for circuit fault feature extraction

Abstract

To solve the problem of feature extraction in electronic circuits due to the nonstationary and nonlinear characteristics of fault signals, a fault feature extraction method for electronic circuits is proposed, which combines wavelet packet analysis and an improved landmark ISOMAP mapping algorithm. The wavelet packet technology is used to decompose and reconstruct the fault feature signals at multiple levels. The extracted wavelet entropy is used to construct the feature vector matrix. The density-based spatial clustering of applications with noise (DBSCAN) clustering algorithm is used to calculate and screen the landmark points. The improved landmark ISOMAP is used to embed the high-dimensional fault feature parameter set into the low-dimensional eigenspace, extract the low-dimensional and sensitive fault feature subset, and apply the support vector machine to identify the fault. The fault diagnosis experiment of the three-phase VIENNA rectifier shows that compared with the principal component analysis method, the traditional ISOMAP method, and the landmark ISOMAP method, the landmark ISOMAP method based on DBSCAN clustering algorithm extracts the fault signal characteristics of electronic equipment more easily.

Keywords

• electronic circuit failure
• feature extraction
• wavelet packet analysis
• dbscan algorithm
• isometric feature mapping method of landmarks
• support vector machines