Frontiers in Materials (Dec 2019)

Nanoscale X-Ray Diffraction of Silk Fibers

  • Christian Riekel,
  • Manfred Burghammer,
  • Martin Rosenthal

DOI
https://doi.org/10.3389/fmats.2019.00315
Journal volume & issue
Vol. 6

Abstract

Read online

This report focuses on current possibilities and perspectives of scanning X-ray nanodiffraction for probing nanoscale heterogeneities in silk fibers such as nanofibrils, skin-core morphologies, nanocrystalline inclusions and fine fibers down to submicron diameters.

Keywords