A Novel Strategy for Detecting Permittivity and Loss Tangent of Low-Loss Materials Based on Cylindrical Resonant Cavity
Jin Zou,
Chuan-Jian Li,
Chen Zheng,
Dong Wang,
Jian Zhang,
Xin Wang,
Jun-Ying Zhang,
Zhi-Ling Hou
Affiliations
Jin Zou
College of Mathematics and Physics & Being Key Laboratory of Environmentally Harmful Chemical Analysis, Beijing University of Chemical Technology, Beijing 100029, China
Chuan-Jian Li
College of Mathematics and Physics & Being Key Laboratory of Environmentally Harmful Chemical Analysis, Beijing University of Chemical Technology, Beijing 100029, China
Chen Zheng
Aerospace Institute of Advanced Materials & Processing Technology, Beijing 100074, China
Dong Wang
Second Military Representative Office of Air Force, Beijing 100074, China
Jian Zhang
Aerospace Institute of Advanced Materials & Processing Technology, Beijing 100074, China
Xin Wang
Beijing Research Institute of High-Tech, Beijing 100094, China
Jun-Ying Zhang
College of Mathematics and Physics & Being Key Laboratory of Environmentally Harmful Chemical Analysis, Beijing University of Chemical Technology, Beijing 100029, China
Zhi-Ling Hou
College of Mathematics and Physics & Being Key Laboratory of Environmentally Harmful Chemical Analysis, Beijing University of Chemical Technology, Beijing 100029, China
Accurate measurement of the permittivity and loss tangent of low-loss materials is essential due to their special applications in the field of ultra large scale integrated circuits and microwave devices. In this study, we developed a novel strategy that can accurately detect the permittivity and loss tangent of low-loss materials based on a cylindrical resonant cavity supporting the TE111 mode in X band (8–12 GHz). Based on an electromagnetic field simulation calculation of the cylindrical resonator, permittivity is precisely retrieved by exploring and analyzing the perturbation of the coupling hole and sample size on the cutoff wavenumber. A more precise approach to measuring the loss tangent of samples with various thicknesses has been proposed. The test results of the standard samples verify that this method can accurately measure the dielectric properties of samples that have smaller sizes than the high Q cylindrical cavity method.
