Measurement of the third order nonlinear susceptibility of paratellurite single crystal using multiplex CARS
Zakaniaina Rajaofara,
Philippe Leproux,
Erwan Capitaine,
Hideaki Kano,
Tomokatsu Hayakawa,
Philippe Thomas,
Jean-René Duclère,
Vincent Couderc
Affiliations
Zakaniaina Rajaofara
Institut de Recherche sur les Céramiques, UMR 7315 CNRS-Université de Limoges, Centre Européen de la Céramique, 12, rue Atlantis, 87068 Limoges Cedex, France
Philippe Leproux
Institut XLIM, UMR 7252 CNRS – Université de Limoges, 123, Avenue Albert Thomas, 87060 Limoges Cedex, France
Erwan Capitaine
Institut XLIM, UMR 7252 CNRS – Université de Limoges, 123, Avenue Albert Thomas, 87060 Limoges Cedex, France
Hideaki Kano
Department of Applied Physics, Graduate School of Pure and Applied Sciences, University of Tsukuba, 1-1-1 Tennodai, Tsukuba, Ibaraki, 305-8573, Japan
Tomokatsu Hayakawa
Field of Advanced Ceramics, Department of Life Science and Applied Chemistry, Nagoya Institute of Technology, Gokiso, Showa, Nagoya 466-8555, Japan
Philippe Thomas
Institut de Recherche sur les Céramiques, UMR 7315 CNRS-Université de Limoges, Centre Européen de la Céramique, 12, rue Atlantis, 87068 Limoges Cedex, France
Jean-René Duclère
Institut de Recherche sur les Céramiques, UMR 7315 CNRS-Université de Limoges, Centre Européen de la Céramique, 12, rue Atlantis, 87068 Limoges Cedex, France
Vincent Couderc
Institut XLIM, UMR 7252 CNRS – Université de Limoges, 123, Avenue Albert Thomas, 87060 Limoges Cedex, France
We report the extraction of the real part of the third order nonlinear susceptibility for a c-cut paratellurite (TeO2 − α) single crystal using the nonresonant contribution of the multiplex coherent anti-Stokes Raman scattering (M-CARS) signal. Using fused silica and SF57 as nonlinear reference materials, we derive the absolute value of the real part of the electronic third order susceptibility and we evidence the in-plane modulation of the nonlinear refractive index. These results are in total agreement with those recently obtained by the z-scan method.
