A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

E. Nazaretski; D. S. Coburn; W. Xu; J. Ma; H. Xu; R. Smith; X. Huang; Y. Yang; L. Huang; M. Idir; A. Kiss; Y. S. Chu

doi:10.1107/S1600577522007056

Journal of Synchrotron Radiation (Sep 2022)

A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II

E. Nazaretski,
D. S. Coburn,
W. Xu,
J. Ma,
H. Xu,
R. Smith,
X. Huang,
Y. Yang,
L. Huang,
M. Idir,
A. Kiss,
Y. S. Chu

Affiliations

E. Nazaretski: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
D. S. Coburn: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
W. Xu: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
J. Ma: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
H. Xu: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
R. Smith: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
X. Huang: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
Y. Yang: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
L. Huang: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
M. Idir: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
A. Kiss: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
Y. S. Chu: National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA

DOI: https://doi.org/10.1107/S1600577522007056
Journal volume & issue: Vol. 29, no. 5
pp. 1284 – 1291

Abstract

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The development, construction, and first commissioning results of a new scanning microscope installed at the 5-ID Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II are reported. The developed system utilizes Kirkpatrick–Baez mirrors for X-ray focusing. The instrument is designed to enable spectromicroscopy measurements in 2D and 3D with sub-200 nm spatial resolution. The present paper focuses on the design aspects, optical considerations, and specifics of the sample scanning stage, summarizing some of the initial commissioning results.

Published in Journal of Synchrotron Radiation

ISSN: 0909-0495 (Print); 1600-5775 (Online)
Publisher: International Union of Crystallography
Country of publisher: United Kingdom
LCC subjects: Science: Physics: Nuclear and particle physics. Atomic energy. Radioactivity; Science: Chemistry: Crystallography
Website: https://journals.iucr.org/s/

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