Optimal Computational Modeling and Simulation of QCA Reversible Gates for Information Reliability in Nano-Quantum Circuits

Abstract

As the relationship between energy and information loss and reversible gates was revealed, much interest in reversible gate design arose, and as quantum-dot cellular automata (QCA) gained attention as a next-generation nano circuit design technology, various reversible gates based on QCA emerged. The proposed study optimizes the performance and design costs of existing QCA-based reversible gates including TR, RUG, PQR, and URG. According to most indicators, the proposed circuits showed significant improvement rates and outperformed existing studies. In particular, the proposed optimal TR, RUG, PQR, and URG showed performance improvements of 266%, 265%, 300%, and 144% in CostAD, respectively, compared with the best existing circuit. This shows outstanding improvement and superiority in terms of area and delay, which are the most important factors in the performance of nano-scale circuits that are becoming extremely miniaturized. Additionally, the exceptionally high-output polarization of the proposed circuits is an important indicator of the circuit’s expansion and connection and increases the circuit’s reliability.

Keywords

• nanotechnology
• quantum-dot cellular automata
• reversible gate
• circuit reliability
• information security