Comments on the XPS Analysis of Carbon Materials

Abstract

The surface chemistry of carbon materials is predominantly explored using x-ray photoelectron spectroscopy (XPS). However, many published papers have critical failures in the published analysis, stemming from an ill-informed approach to analyzing the spectroscopic data. Herein, a discussion on lineshapes and changes in the spectral envelope of predominantly graphitic materials are explored, together with the use of the D-parameter, to ascertain graphitic content, using this information to highlight a simple and logical approach to strengthen confidence in the functionalization derived from the carbon core-level spectra.

Keywords

• carbon
• XPS
• oxygen
• fitting
• quantification