Atomistic Insights into the Phase Transformation of Single-Crystal Silicon during Nanoindentation

Abstract

The influence of the indenter angle on the deformation mechanisms of single-crystal Si was analyzed via molecular dynamics simulations of the nanoindentation process. Three different types of diamond conical indenters with semi-angles of 45°, 60°, and 70° were used. The load–indentation depth curves were obtained by varying the indenter angles, and the structural phase transformations of single-crystal Si were observed from an atomistic view. In addition, the hardness and elastic modulus with varying indenter angles were evaluated based on the Oliver–Pharr method and Sneddon’s solution. The simulation results showed that the indenter angle had a significant effect on the load–indentation depth curves, which resulted from the strong dependence of the elastic and plastic deformation ratios on the indenter angle during indentations.

Keywords

• nanoindentation
• indenter angle
• phase transformation
• silicon
• atomistic simulation