Genetics and breeding for resistance against four leaf spot diseases in wheat (Triticum aestivum L.)

Pushpendra Kumar Gupta; Pushpendra Kumar Gupta; Pushpendra Kumar Gupta; Neeraj Kumar Vasistha; Neeraj Kumar Vasistha; Sahadev Singh; Arun Kumar Joshi; Arun Kumar Joshi

doi:10.3389/fpls.2023.1023824

Frontiers in Plant Science (Mar 2023)

Genetics and breeding for resistance against four leaf spot diseases in wheat (Triticum aestivum L.)

Pushpendra Kumar Gupta,
Pushpendra Kumar Gupta,
Pushpendra Kumar Gupta,
Neeraj Kumar Vasistha,
Neeraj Kumar Vasistha,
Sahadev Singh,
Arun Kumar Joshi,
Arun Kumar Joshi

Affiliations

Pushpendra Kumar Gupta: Department of Genetics and Plant Breeding, Chaudhary Charan Singh University, Meerut, India
Pushpendra Kumar Gupta: Murdoch’s Centre for Crop and Food Innovation, Murdoch University, Murdoch, WA, Australia
Pushpendra Kumar Gupta: Borlaug Institute for South Asia (BISA), National Agricultural Science Complex (NASC), Dev Prakash Shastri (DPS) Marg, New Delhi, India
Neeraj Kumar Vasistha: Department of Genetics and Plant Breeding, Chaudhary Charan Singh University, Meerut, India
Neeraj Kumar Vasistha: Department of Genetics-Plant Breeding and Biotechnology, Dr Khem Singh Gill, Akal College of Agriculture, Eternal University, Baru Sahib, Sirmour, India
Sahadev Singh: Department of Genetics and Plant Breeding, Chaudhary Charan Singh University, Meerut, India
Arun Kumar Joshi: Borlaug Institute for South Asia (BISA), National Agricultural Science Complex (NASC), Dev Prakash Shastri (DPS) Marg, New Delhi, India
Arun Kumar Joshi: The International Maize and Wheat Improvement Center (CIMMYT), National Agricultural Science Complex (NASC), Dev Prakash Shastri (DPS) Marg, New Delhi, India

DOI: https://doi.org/10.3389/fpls.2023.1023824
Journal volume & issue: Vol. 14

Abstract

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In wheat, major yield losses are caused by a variety of diseases including rusts, spike diseases, leaf spot and root diseases. The genetics of resistance against all these diseases have been studied in great detail and utilized for breeding resistant cultivars. The resistance against leaf spot diseases caused by each individual necrotroph/hemi-biotroph involves a complex system involving resistance (R) genes, sensitivity (S) genes, small secreted protein (SSP) genes and quantitative resistance loci (QRLs). This review deals with resistance for the following four-leaf spot diseases: (i) Septoria nodorum blotch (SNB) caused by Parastagonospora nodorum; (ii) Tan spot (TS) caused by Pyrenophora tritici-repentis; (iii) Spot blotch (SB) caused by Bipolaris sorokiniana and (iv) Septoria tritici blotch (STB) caused by Zymoseptoria tritici.

Published in Frontiers in Plant Science

ISSN: 1664-462X (Online)
Publisher: Frontiers Media S.A.
Country of publisher: Switzerland
LCC subjects: Agriculture: Plant culture
Website: https://www.frontiersin.org/journals/plant-science

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