Highly Luminous Ba₂SiO_4−δN_2/3δ:Eu²⁺ Phosphor for NUV-LEDs: Origin of PL-Enhancement by N³⁻-Substitution

Abstract

Ba2SiO4−δN2/3δ:Eu2+ (BSON:Eu2+) materials with different N3− contents were successfully prepared and characterized. Rietveld refinements showed that N3− ions were partially substituted for the O2− ions in the SiO4-tetrahedra because the bond lengths of Si‒(O,N) (average value = 1.689 Å) were slightly elongated compared with those of Si‒O (average value = 1.659 Å), which resulted in the minute compression of the Ba(2)‒O bond lengths from 2.832 to 2.810 Å. The average N3− contents of BSON:Eu2+ phosphors were determined from 100 nm to 2000 nm depth of grain using a secondary ion mass spectrometry (SIMS): 0.064 (synthesized using 100% α-Si3N4), 0.035 (using 50% α-Si3N4 and 50% SiO2), and 0.000 (using 100% SiO2). Infrared (IR) and X-ray photoelectron spectroscopy (XPS) measurements corroborated the Rietveld refinements: the new IR mode at 850 cm−1 (Si‒N stretching vibration) and the binding energy at 98.6 eV (Si-2p) due to the N3- substitution. Furthermore, in UV-region, the absorbance of N3−-substituted BSON:Eu2+ (synthesized using 100% α-Si3N4) phosphor was about two times higher than that of BSO:Eu2+ (using 100% SiO2). Owing to the N3− substitution, surprisingly, the photoluminescence (PL) and LED-PL intensity of BSON:Eu2+ (synthesized using 100% α-Si3N4) was about 5.0 times as high as that of BSO:Eu2+ (using 100% SiO2). The compressive strain estimated by the Williamson−Hall (W−H) method, was slightly increased with the higher N3− content in the host-lattice of Ba2SiO4, which warranted that the N3- ion plays an important role in the highly enhanced PL intensity of BSON:Eu2+ phosphor. These phosphor materials could be a bridgehead for developing new phosphors and application in white NUV-LEDs field.

Keywords

• Ba₂SiO₄:Eu²⁺
• N³⁻ substitution
• SIMS
• IR
• XPS
• PL