Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges

Abstract

This review presents a concise overview of RF (radio frequency) power transistor behavior models, which is crucial for optimizing RF performance in high-frequency applications like wireless communication, radar, and satellites. The paper highlights the significance of accurate modeling in understanding transistor behavior and traces the evolution of behavior modeling techniques. Different behavior modeling strategies, such as LUT (look-up table) based models, polynomial equation-based models, and machine learning based models, are discussed along with their unique characteristics and modeling challenges. The review explores the difference between behavior models and the conventional empirical or physics-based modeling approaches, addressing the challenges of the accurate characterization of transistors at high frequencies and power levels. This paper concludes with an outlook of emerging trends, such as physical models combined with behavior models, shaping the future of RF power transistor modeling for more efficient communication systems.

Keywords

• behavior model
• nonlinear distortion
• parameter extraction
• memory effects