Degradation Characteristics and Mechanism of High Speed 850 nm Vertical-Cavity Surface-Emitting Laser during Accelerated Aging
Jide Zhang,
Wenyuan Liao,
Xiaohua Wang,
Guoguang Lu,
Shaohua Yang,
Zhipeng Wei
Affiliations
Jide Zhang
State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, Changchun 130022, China
Wenyuan Liao
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, The Fifth Electronic Research Institute of the Ministry of Industry and Information Technology, Guangzhou 511370, China
Xiaohua Wang
State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, Changchun 130022, China
Guoguang Lu
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, The Fifth Electronic Research Institute of the Ministry of Industry and Information Technology, Guangzhou 511370, China
Shaohua Yang
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, The Fifth Electronic Research Institute of the Ministry of Industry and Information Technology, Guangzhou 511370, China
Zhipeng Wei
State Key Laboratory of High Power Semiconductor Laser, Changchun University of Science and Technology, Changchun 130022, China
The degradation process of Vertical-cavity Surface-emitting lasers with high speed and a central wavelength at 850 nm is investigated via constant-current accelerated aging experiments. Degradation of the photoelectric performances under different operating conditions are characterized by optical output power, and forward and reverse bias current–voltage. The 1/f noise characteristics and formation mechanism are discussed in terms of the experimental results of low frequency noise below threshold current. The main composition of low frequency noise before and after aging, the bias current dependence and the origin of the noise are analyzed emphatically. The correlation between the degradation suggests that the loss of photoelectric performance and the fluctuation of low frequency noise characteristic can be attributed to the contagion of defects towards the active region of Vertical-cavity Surface-emitting lasers. Furthermore, the results of failure analysis confirmed the conclusion that the contagion of defects occurred towards the active region of the samples after aging.
