Measurement Science Review (Jan 2009)

Multi-Wavelength Interferometry for Length Measurements Using Diode Lasers

Meiners-Hagen K.,
Schödel R.,
Pollinger F.,
Abou-Zeid A.

Affiliations

Meiners-Hagen K.: Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig, Germany
Schödel R.: Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig, Germany
Pollinger F.: Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig, Germany
Abou-Zeid A.: Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig, Germany

DOI: https://doi.org/10.2478/v10048-009-0001-y
Journal volume & issue: Vol. 9, no. 1
pp. 16 – 26

Abstract

No abstracts available.

Published in Measurement Science Review

ISSN: 1335-8871 (Online)
Publisher: Sciendo
Country of publisher: Poland
LCC subjects: Science: Mathematics
Website: https://sciendo.com/journal/MSR

About the journal