A Novel Two-Terminal Reliability Analysis for MANET

Xibin Zhao; Zhiyang You; Hai Wan

doi:10.1155/2013/216186

Journal of Applied Mathematics (Jan 2013)

A Novel Two-Terminal Reliability Analysis for MANET

Xibin Zhao,
Zhiyang You,
Hai Wan

Affiliations

Xibin Zhao: Key Laboratory for Information System Security of Ministry of Education, School of Software, Tsinghua University, Beijing 100084, China
Zhiyang You: Key Laboratory for Information System Security of Ministry of Education, School of Software, Tsinghua University, Beijing 100084, China
Hai Wan: Key Laboratory for Information System Security of Ministry of Education, School of Software, Tsinghua University, Beijing 100084, China

DOI: https://doi.org/10.1155/2013/216186
Journal volume & issue: Vol. 2013

Abstract

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Mobile ad hoc network (MANET) is a dynamic wireless communication network. Because of the dynamic and infrastructureless characteristics, MANET is vulnerable in reliability. This paper presents a novel reliability analysis for MANET. The node mobility effect and the node reliability based on a real MANET platform are modeled and analyzed. An effective Monte Carlo method for reliability analysis is proposed. A detailed evaluation is performed in terms of the experiment results.

Published in Journal of Applied Mathematics

ISSN: 1110-757X (Print); 1687-0042 (Online)
Publisher: Wiley
Country of publisher: United Kingdom
LCC subjects: Science: Mathematics
Website: https://onlinelibrary.wiley.com/journal/4185

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