Experimental comparison of three methods to measure electron source properties for synchrotron radiation

Abstract

Measuring the electron source size is essential for determining the emittance of synchrotron radiation. Pinhole imaging is the most common technique which measures the source profile in all transverse directions. The grating interferometry technique measures the coherence function of the x-ray beam, which indirectly determines the source size. The newly developed phase-space beam position and size monitor (ps-BPM) system provide information on electron source properties: position, angle, size, and divergence. These three techniques were used to determine the source size at a bend magnet beamline at the Canadian Light Source. In this work, we compare experimental results from these measurements at the same time, which is used as a cross-calibration procedure for each method.