K-Codiagnosability Verification of Labeled Petri Nets

Ning Ran; Jinyuan Hao; Zijian Dong; Zhou He; Zhiheng Liu; Yuan Ruan; Shouguang Wang

doi:10.1109/ACCESS.2019.2959904

IEEE Access (Jan 2019)

K-Codiagnosability Verification of Labeled Petri Nets

Ning Ran,
Jinyuan Hao,
Zijian Dong,
Zhou He,
Zhiheng Liu,
Yuan Ruan,
Shouguang Wang

Affiliations

Ning Ran: ORCiD; College of Electronic and Information Engineering, Hebei University, Baoding, China
Jinyuan Hao: ORCiD; HBU-UCLan School of Media, Communication and Creative Industries, Hebei University, Baoding, China
Zijian Dong: ORCiD; Department of Automation, North China Electric Power University, Baoding, China
Zhou He: ORCiD; College of Mechanical and Electrical Engineering, Shaanxi University of Science and Technology, Xi’an, China
Zhiheng Liu: ORCiD; College of Electronic and Information Engineering, Hebei University, Baoding, China
Yuan Ruan: School of Information and Electronic Engineering, Zhejiang Gongshang University, Hangzhou, China
Shouguang Wang: ORCiD; School of Information and Electronic Engineering, Zhejiang Gongshang University, Hangzhou, China

DOI: https://doi.org/10.1109/ACCESS.2019.2959904
Journal volume & issue: Vol. 7
pp. 185055 – 185062

Abstract

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Fault detection is quite important for discrete event systems. We investigate K-codiagnosability of Petri nets in this paper under the framework that some local sites monitor the operation of the system using their own masks. They exchange information with a coordinator while do not communicate with each other. A fault is detected when there exists a site can diagnose it. We recall the notion of Modified Verifier Nets (MVNs), and prove that K-codiagnosability can be verified looking at some special cycles in the reachability or coverability graph of the MVN. In particular, the proposed approach is available for bounded and unbounded nets. Finally, we give an algorithm to compute the minimum value of K.

Published in IEEE Access

ISSN: 2169-3536 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

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