Open Physics (Mar 2003)
Multilayer optics for XUV spectral region: technology fabrication and applications
- Andreev S.,
- Akhsakhalyan A.,
- Bibishkin M.,
- Chkhalo N.,
- Gaponov S.,
- Gusev S.,
- Kluenkov E.,
- Prokhorov K.,
- Salashchenko N.,
- Schafers F.,
- Zuev S.
Affiliations
- Andreev S.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Akhsakhalyan A.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Bibishkin M.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Chkhalo N.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Gaponov S.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Gusev S.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Kluenkov E.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Prokhorov K.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Salashchenko N.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- Schafers F.
- BESSY II, Albert Einstein St. 15, D-12489, Berlin, FRG
- Zuev S.
- Institute for Physics of Microstructures RAS and X-Ray company, GSP105, 603600, Nizhny Novgorod, Russia
- DOI
- https://doi.org/10.2478/BF02475561
- Journal volume & issue
-
Vol. 1,
no. 1
pp. 191 – 209
Abstract
No abstracts available.Keywords
- multilayer mirror
- reflection
- spectral resolution
- synchrotron radiation
- x-ray tube
- soft
- x-ray radiation
- water window
- reflectometer
- euv-lithography
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