Combining SIMS elemental mapping with FIB-based imaging for multimodal analysis of biological specimen

Affiliations

Biesemeier Antje: Advanced Instrumentation for Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology
de Castro Olivier: Advanced Instrumentation for Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology
Taubitz Tatjana: Advanced Instrumentation for Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology
Berro Zahraa: Advanced Instrumentation for Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology
Audinot Jean-Nicolas: Advanced Instrumentation for Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology
Wirtz Tom: Advanced Instrumentation for Nano-Analytics, Materials Research and Technology Department, Luxembourg Institute of Science and Technology

Abstract

No abstracts available.