Journal of Data and Information Science (Sep 2017)

Comparative Study of Trace Metrics between Bibliometrics and Patentometrics

Ye Fred Y.,
Huang Mu-Hsuan,
Chen Dar-Zen

Affiliations

Ye Fred Y.: School of Information Management, Nanjing University, Nanjing210023, China
Huang Mu-Hsuan: Department of Library and Information Science, Taiwan University, Taipei10617, China
Chen Dar-Zen: Department of Mechanical Engineering and Institute of Industrial Engineering, Taiwan University, Taipei10617, China

DOI: https://doi.org/10.20309/jdis.201611
Journal volume & issue: Vol. 1, no. 2
pp. 13 – 31

Abstract

To comprehensively evaluate the overall performance of a group or an individual in both bibliometrics and patentometrics.

Published in Journal of Data and Information Science

ISSN: 2096-157X (Print); 2543-683X (Online)
Publisher: Sciendo
Country of publisher: Poland
LCC subjects: Technology: Technology (General): Industrial engineering. Management engineering: Information technology; Science: Mathematics: Instruments and machines: Electronic computers. Computer science
Website: https://sciendo.com/journal/JDIS

About the journal