Dynamic self-stabilization in the electronic and nanomechanical properties of an organic polymer semiconductor

Illia Dobryden; Vladimir V. Korolkov; Vincent Lemaur; Matthew Waldrip; Hio-Ieng Un; Dimitrios Simatos; Leszek J. Spalek; Oana D. Jurchescu; Yoann Olivier; Per M. Claesson; Deepak Venkateshvaran

doi:10.1038/s41467-022-30801-x

Nature Communications (Jun 2022)

Dynamic self-stabilization in the electronic and nanomechanical properties of an organic polymer semiconductor

Illia Dobryden,
Vladimir V. Korolkov,
Vincent Lemaur,
Matthew Waldrip,
Hio-Ieng Un,
Dimitrios Simatos,
Leszek J. Spalek,
Oana D. Jurchescu,
Yoann Olivier,
Per M. Claesson,
Deepak Venkateshvaran

Affiliations

Illia Dobryden: Division of Surface and Corrosion Science, Department of Chemistry, School of Engineering Sciences in Chemistry, Biotechnology and Health, KTH Royal Institute of Technology
Vladimir V. Korolkov: Park Systems UK Limited, MediCity Nottingham
Vincent Lemaur: Laboratory for Chemistry of Novel Materials, University of Mons
Matthew Waldrip: Department of Physics and Center for Functional Materials, Wake Forest University
Hio-Ieng Un: Cavendish Laboratory, University of Cambridge
Dimitrios Simatos: Cavendish Laboratory, University of Cambridge
Leszek J. Spalek: Cavendish Laboratory, University of Cambridge
Oana D. Jurchescu: Department of Physics and Center for Functional Materials, Wake Forest University
Yoann Olivier: Laboratory for Computational Modelling of Functional Materials, Namur Institute of Structured Matter, Université de Namur
Per M. Claesson: Division of Surface and Corrosion Science, Department of Chemistry, School of Engineering Sciences in Chemistry, Biotechnology and Health, KTH Royal Institute of Technology
Deepak Venkateshvaran: Cavendish Laboratory, University of Cambridge

DOI: https://doi.org/10.1038/s41467-022-30801-x
Journal volume & issue: Vol. 13, no. 1
pp. 1 – 11

Abstract

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Organic polymer nanomechanics has been explored through precise nanometre-scale stiffness measurements in a high-mobility semiconducting polymer. Higher eigen-mode atomic force microscopy is used to measure nanomechnical variations in the film texture, as well as the nanoscale order in the material.

Published in Nature Communications

ISSN: 2041-1723 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Science
Website: https://www.nature.com/ncomms/

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