METHODS OF PERFORMANCE MONITORING DEVICES BY INDIRECT PARAMETERS

Abstract

Background. According to electronics failure analysis, 90 % of failures occur in a very limited number of failed component types. Possible causes of failures of these types of components are easy to analyze. The paper considers the least statistically reliable elements – power transistors and electrolytic capacitors. The analysis of influencing factors is carried out and a technique is proposed aimed at determining the operable state of the device. Materials and methods. To solve the tasks set, methods of system analysis, reliability theory, and materials science are used. Results. The article discusses modern approaches to monitoring the performance of a device by indirect parameters of electronic devices. The shortcomings of the approaches used are noted. An analysis of the impact of factors on the service life of the device was carried out, on the basis of which a methodology was developed for assessing the control of the device's performance by indirect parameters related to power transistors and electrolytic capacitors for the electronic unit based on a mathematical model that takes into account operating conditions. Conclusions. Based on the proposed methodology, it is advisable to create a system for registering external influences, which allows real-time monitoring of operating conditions and, taking them into account, predicting the residual life of the electronic unit.

Keywords

• failure
• reliability
• temperature
• vibration
• resource
• model