A Reference-Free Image Index to Simultaneously Quantify Infrared-Imaging Fixed-Pattern-Noise and Blur Artifacts

Abstract

A reference-free image index to jointly assess infrared-imaging fixed-pattern-noise and blur artifacts is proposed in this work. The proposed index is based on tuned-spatial-domain filtering, which works by combining two Laplace operators to simultaneously quantify the global infrared-imaging fixed-pattern-noise and the global or local blur artifacts. The index effectiveness is demonstrated by two task-based image-quality assessments to determine the focused and fixed-pattern-noise free images from sequences captured with both a mid-wave-infrared microscope system and a long-wave-infrared plenoptic system. The index quantitative limits are shown on numerical computations over synthetic corrupted images as well as real black-body radiator calibrated infrared images with representative simulated fixed-pattern noise, from six well known infrared focal plane arrays transducer technologies, along with artificial blur added using real infrared imaging system point spread functions.

Keywords

• Infrared imaging
• infrared imaging index
• non-uniformity noise
• plenoptic
• infrared microscopy