Semiconductor Physics, Quantum Electronics & Optoelectronics (Jul 2019)

Optical studies of as-deposited and annealed Cu7GeS5I thin films

  • I.P. Studenyak

DOI
https://doi.org/10.15407/spqeo19.02.192
Journal volume & issue
Vol. 19, no. 2
pp. 192 – 196

Abstract

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Cu7GeS5I thin films were obtained by non-reactive radio frequency magnetron sputtering onto silicate glass substrates. Optical transmission spectra of as-deposited and annealed Cu7GeS5I thin films were measured in the temperature interval 77–300 K. The temperature behaviour of Urbach absorption edge and dispersion of refractive index for as-deposited and annealed Cu7GeS5I thin films was analyzed. Influence of annealing on the optical parameters and disordering processes in Cu7GeS5I thin films was studied.

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