In Situ Investigations on Stress and Microstructure Evolution in Polycrystalline Ti(C,N)/α-Al₂O₃ CVD Coatings under Thermal Cycling Loads

Abstract

The stress behavior and the associated microstructure evolution of industrial Ti(C,N)/α-Al2O3 coatings subjected to thermal cycling are investigated by in situ energy dispersive synchrotron X-ray diffraction and transmission electron microscopy. Temperature-dependent stresses and changes in microstructural parameters (domain size and microstrain) are analyzed by in situ measurements at different temperatures between 25 and 800 °C, both in the heating up and cooling down step, including several thermal cycles. Transmission electron microscopy is used to evaluate defects before and after the thermal treatment. The introduction of high compressive stresses in α-Al2O3 by top-blasting is connected to a high defect density at the basal planes of the alumina layer. The stress relaxation of the alumina layer at high temperatures is associated with a successive annihilation of defects until a reversible temperature-dependent stress condition is set. Top-blasting does not change the initial microstructure and residual stress of the Ti(C,N) layer. Ti(C,N) shows a cyclic stress behavior associated with the heat treatment and an elastic deformation behavior in the temperature range investigated.

Keywords

• Ti(C,N)/α-Al₂O₃ CVD coatings
• residual and thermal stresses
• synchrotron X-ray diffraction
• TEM characterization
• microstructure evolution