Localized Strain Measurement in Molecular Beam Epitaxially Grown Chalcogenide Thin Films by Micro-Raman Spectroscopy

• Qiu Li,
• Yong Wang,
• Tiantian Li,
• Wei Li,
• Feifan Wang,
• Anderson Janotti,
• Stephanie Law,
• Tingyi Gu

Affiliations

Qiu Li

Tianjin Key Laboratory of High Speed Cutting and Precision Machining, Tianjin University of Technology and Education, Tianjin, China

Yong Wang

Department of Materials Science and Engineering, University of Delaware, Newark, Delaware, United States

Tiantian Li

Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware, United States

Wei Li

Department of Materials Science and Engineering, University of Delaware, Newark, Delaware, United States

Feifan Wang

Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware, United States

Anderson Janotti

Department of Materials Science and Engineering, University of Delaware, Newark, Delaware, United States

Stephanie Law

Department of Materials Science and Engineering, University of Delaware, Newark, Delaware, United States

Tingyi Gu

Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware, United States