Versatility of uniformly doped graphene quantum Hall arrays in series
S. M. Mhatre,
N. T. M. Tran,
H. M. Hill,
C.-C. Yeh,
D. Saha,
D. B. Newell,
A. R. Hight Walker,
C.-T. Liang,
R. E. Elmquist,
A. F. Rigosi
Affiliations
S. M. Mhatre
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Mississippi 8171, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA
N. T. M. Tran
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Mississippi 8171, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA
H. M. Hill
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Mississippi 8171, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA
C.-C. Yeh
Graduate Institute of Applied Physics, National Taiwan University, Taipei 10617, Taiwan
D. Saha
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Mississippi 8171, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA
D. B. Newell
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Mississippi 8171, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA
A. R. Hight Walker
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Mississippi 8171, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA
C.-T. Liang
Department of Physics, National Taiwan University, Taipei 10617, Taiwan
R. E. Elmquist
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Mississippi 8171, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA
A. F. Rigosi
Physical Measurement Laboratory, National Institute of Standards and Technology (NIST), Mississippi 8171, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA
In this work, the limiting factors for developing metrologically useful arrays from epitaxial graphene on SiC are lifted with a combination of centimeter-scale, high-quality material growth and the implementation of superconducting contacts. Standard devices for metrology have been restricted to having a single quantized value output based on the ν = 2 Landau level. With the demonstrations herein of devices having multiple outputs of quantized values available simultaneously, these versatile devices can be used to disseminate the ohm globally. Such devices are designed to give access to quantized resistance values over the range of three orders of magnitude, starting as low as the standard value of ∼12.9 kΩ and reaching as high as 1.29 MΩ. Several experimental methods are used to assess the quality and versatility of the devices, including standard lock-in techniques and Raman spectroscopy.
