AIP Advances (Jan 2017)

GaAs/Ge/Si epitaxial substrates: Development and characteristics

  • Yury Buzynin,
  • Vladimir Shengurov,
  • Boris Zvonkov,
  • Alexander Buzynin,
  • Sergey Denisov,
  • Nikolay Baidus,
  • Michail Drozdov,
  • Dmitry Pavlov,
  • Pavel Yunin

DOI
https://doi.org/10.1063/1.4974498
Journal volume & issue
Vol. 7, no. 1
pp. 015304 – 015304-6

Abstract

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We developed high quality 2-inch GaAs/Ge/Si (100) epitaxial substrates, which may be used instead of GaAs monolithic substrates for fabrication of solar cells, photodetectors, LEDs, lasers, etc. A 200–300 nm Ge buffer layer was grown on Si substrates using the HW-CVD technique at 300°C, a tantalum strip heated to 1400°C was used as the “hotwire”. The MOCVD method was used to grow a 1 μ GaAs layer on a Ge buffer. The TDD in the GaAs layers did not exceed (1–2)∙105 cm-2 and the surface RMS roughness value was under 1 nm.