Dependability Analysis of 5G-AKA Authentication Service From Server and User Perspectives

Lili Jiang; Xiaolin Chang; Jing Bai; Jelena Misic; Vojislav Misic; Zhi Chen

doi:10.1109/ACCESS.2020.2993111

IEEE Access (Jan 2020)

Dependability Analysis of 5G-AKA Authentication Service From Server and User Perspectives

Lili Jiang,
Xiaolin Chang,
Jing Bai,
Jelena Misic,
Vojislav Misic,
Zhi Chen

Affiliations

Lili Jiang: ORCiD; Beijing Key Laboratory of Security and Privacy in Intelligent Transportation, Beijing Jiaotong University, Beijing, China
Xiaolin Chang: ORCiD; Beijing Key Laboratory of Security and Privacy in Intelligent Transportation, Beijing Jiaotong University, Beijing, China
Jing Bai: ORCiD; Beijing Key Laboratory of Security and Privacy in Intelligent Transportation, Beijing Jiaotong University, Beijing, China
Jelena Misic: ORCiD; Computer Science Department, Ryerson University, Toronto, ON, Canada
Vojislav Misic: ORCiD; Computer Science Department, Ryerson University, Toronto, ON, Canada
Zhi Chen: ORCiD; Beijing Key Laboratory of Security and Privacy in Intelligent Transportation, Beijing Jiaotong University, Beijing, China

DOI: https://doi.org/10.1109/ACCESS.2020.2993111
Journal volume & issue: Vol. 8
pp. 89562 – 89574

Abstract

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The fifth generation (5G) technology offers a set of security services in order to provide secure communication to a large number of various devices. 5G Authentication and Key Agreement (5G-AKA) authentication service acts as the first step of securing the 5G network communication. This paper aims to quantitatively analyze the dependability of 5G-AKA authentication service. We develop the continuous-time Markov chain (CTMC) models to capture the operational details of the 5G-AKA authentication services when facing the service failure. We also derive formulas for calculating metrics of interest, including Defects Per Million (DPM), authentication service's first restoration time from failure and total cost of ownership (TCO). Extensive numerical analysis is applied to investigate the impact of parameters on the evaluation metrics.

Published in IEEE Access

ISSN: 2169-3536 (Online)
Publisher: IEEE
Country of publisher: United States
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

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