Determination of Self-Neutralization Phenomena of Ion Beams with Langmuir Probe Measurements and PIC-DSMC Simulations

Abstract

Small mN-class gridded ion thrusters are usually tested in a vacuum chamber without the use of a neutralizer, relying on self-neutralization of the ion beam due to interaction with facility walls. Langmuir probe measurements performed immediately downstream of such a thruster reveal values of the plasma potential of several hundreds of volts. If this locally very high potential indeed exists, it would have significant impact on the erosion rate of RIT grids and thus reduce the lifetime of thrusters compared to the generally accepted plasma potential of a few tens of volts. Further measurements performed with a movable Langmuir and emissive probes indicate that the probe mount violates the ability of the ion beam to self-neutralize. This is concluded due to dependence of the measured potential value on the degree of neutralization introduced in the experiment. Particle-in-cell and direct-simulation Monte Carlo simulations of the ion beam corresponding to experimental conditions (ion energy EXe+=1.5 keV and ion beam current IXe+=17 mA) are carried out to determine the phenomena responsible for the self-neutralization; mainly, reactions with neutral species such as ionization by electron or ion impact and secondary electron emission (SEE) from the facility walls are compared. Reasonable agreement with measurements is achieved, and SEE is determined to be the primary source of electrons, indicating that facility and measurement disturbance effects majorly influence testing of (non-neutralized) ion beams. Further, limitations of the applicability of probe diagnostics on non-neutralized ion beams are described.

Keywords

• ion beam
• self neutralization
• Langmuir probe
• PIC
• DSMC
• secondary electron emission