High Temperature Materials and Processes (Jan 1998)

Nanoscale Microstructural Analyses by Atom Probe Field Ion Microscopy

  • Hono, K.,
  • Murayama, M.

DOI
https://doi.org/10.1515/HTMP.1998.17.1-2.69
Journal volume & issue
Vol. 17, no. 1-2
pp. 69 – 86

Abstract

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