Interfacial electronic structure at rubrene/NiFe heterostructure

Pan Yuan; Yuquan Liu; Haipeng Xie; Junhua Wei; Yuan Zhao; Shitan Wang; Yangyang Zhang; Dongmei Niu; Yongli Gao

Results in Physics (Oct 2021)

Interfacial electronic structure at rubrene/NiFe heterostructure

Pan Yuan,
Yuquan Liu,
Haipeng Xie,
Junhua Wei,
Yuan Zhao,
Shitan Wang,
Yangyang Zhang,
Dongmei Niu,
Yongli Gao

Affiliations

Pan Yuan: Institute of Super-Microstructure and Ultrafast Process in Advance Materials, School of Physic and Electronics, Central South University, Changsha, Hunan 410012, China
Yuquan Liu: Institute of Super-Microstructure and Ultrafast Process in Advance Materials, School of Physic and Electronics, Central South University, Changsha, Hunan 410012, China
Haipeng Xie: Institute of Super-Microstructure and Ultrafast Process in Advance Materials, School of Physic and Electronics, Central South University, Changsha, Hunan 410012, China; Corresponding author.
Junhua Wei: Institute of Super-Microstructure and Ultrafast Process in Advance Materials, School of Physic and Electronics, Central South University, Changsha, Hunan 410012, China
Yuan Zhao: Institute of Super-Microstructure and Ultrafast Process in Advance Materials, School of Physic and Electronics, Central South University, Changsha, Hunan 410012, China
Shitan Wang: Institute of Super-Microstructure and Ultrafast Process in Advance Materials, School of Physic and Electronics, Central South University, Changsha, Hunan 410012, China
Yangyang Zhang: Institute of Super-Microstructure and Ultrafast Process in Advance Materials, School of Physic and Electronics, Central South University, Changsha, Hunan 410012, China
Dongmei Niu: Institute of Super-Microstructure and Ultrafast Process in Advance Materials, School of Physic and Electronics, Central South University, Changsha, Hunan 410012, China
Yongli Gao: Department of Physics and Astronomy, University of Rochester, Rochester, NY 14627, United States

Journal volume & issue: Vol. 29
p. 104692

Abstract

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The interface electronic structure between rubrene and permalloy (Ni80Fe20) has been studied by ultraviolet photoelectron spectroscopy (UPS) and X-ray photoelectron spectroscopy (XPS). We find that the downward energy level bending at the rubrene/NiFe heterostructure is caused by the interaction between rubrene and NiFe at the interface. There is an interface dipole of 0.23 eV, pointing from NiFe to rubrene. Our researches deepen the understanding of the fundamentals and laid a foundation for the design of high-performance rubrene-based organic spintronic devices.

Published in Results in Physics

ISSN: 2211-3797 (Online)
Publisher: Elsevier
Country of publisher: Netherlands
LCC subjects: Science: Physics
Website: http://www.journals.elsevier.com/results-in-physics/

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