Doklady Belorusskogo gosudarstvennogo universiteta informatiki i radioèlektroniki (Jun 2019)
NORMALIZATION BASED ON THICKNESS AND PARAMETRIZATION OF CONTOUR LINES ON IMAGES
Abstract
The method of normalization of planimetric lines on thickness based on the mask analysis of local orientations of their fragments is offered. Comparison of the offered method with known methods of a skeletization is made. It is shown that the offered method surpasses known methods of a skeletization in speed and quality. Approaches to parametrization of curves are considered.