APL Materials (Aug 2013)

Strain driven migration of In during the growth of InAs/GaAs quantum posts

  • D. Alonso-Álvarez,
  • B. Alén,
  • J. M. Ripalda,
  • A. Rivera,
  • A. G. Taboada,
  • J. M. Llorens,
  • Y. González,
  • L. González,
  • F. Briones

DOI
https://doi.org/10.1063/1.4818358
Journal volume & issue
Vol. 1, no. 2
pp. 022112 – 022112

Abstract

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Using the mechano-optical stress sensor technique, we observe a counter-intuitive reduction of the compressive stress when InAs is deposited on GaAs (001) during the growth of quantum posts. Through modelling of the strain fields, we find that such anomalous behaviour can be related to the strain-driven detachment of In atoms from the crystal and their surface diffusion towards the self-assembled nanostructures.