IEEE Access (Jan 2021)

Study of AlGaN/GaN Vertical Superjunction HEMT for Improvement of Breakdown Voltage and Specific On-Resistance

  • Miao Zhang,
  • Zhiyou Guo,
  • Yong Huang,
  • Yuan Li,
  • Jiancheng Ma,
  • Xiaoyu Xia,
  • Xiuyang Tan,
  • Fan Xia,
  • Huiqing Sun

DOI
https://doi.org/10.1109/ACCESS.2021.3049374
Journal volume & issue
Vol. 9
pp. 9895 – 9902

Abstract

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A GaN-based vertical superjunction high electron mobility transistor (SJ HEMT) with a composite structure (CS-SJ HEMT) is proposed and analyzed by Silvaco TCAD to improve the breakdown voltage and specific on-resistance (RonA). In this paper, CS-SJ HEMT is compared with SJ HEMT with traditional structure (TS-SJ HEMT), SJ HEMT with only particular doping pillars (DP-SJ HEMT) and SJ HEMT with only special P-gate (SP-SJ HEMT). The particular doping pillars mean the doping concentration of n-pillar increases with a gradient from top to bottom, and the concentration of p-pillar is the same as the middle of n-pillar, which reduces the RonA by only 4%. The special P-GaN cap layer can reduce the RonA by 10%, and it can even increase the on-state current in the saturation region. The CS-SJ HEMT combines both doping pillars and special P-gate structures, and the RonA can be reduced by 14%. By the optimized design, the RonA can be reduced by 30% with BV = 2580 V, or the RonA can be reduced by 21% with BV = 2720 V. These results show that the composite structure of SJ HEMT contributes to improving the BV and RonA and propose a useful approach for improving the vertical HEMTs.

Keywords