Nanomaterials (Aug 2020)

Single-Particle Tracking with Scanning Non-Linear Microscopy

  • Théo Travers,
  • Vincent G. Colin,
  • Matthieu Loumaigne,
  • Régis Barillé,
  • Denis Gindre

DOI
https://doi.org/10.3390/nano10081519
Journal volume & issue
Vol. 10, no. 8
p. 1519

Abstract

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This study describes the adaptation of non-linear microscopy for single-particle tracking (SPT), a method commonly used in biology with single-photon fluorescence. Imaging moving objects with non-linear microscopy raises difficulties due to the scanning process of the acquisitions. The interest of the study is based on the balance between all the experimental parameters (objective, resolution, frame rate) which need to be optimized to record long trajectories with the best accuracy and frame rate. To evaluate the performance of the setup for SPT, several basic estimation methods are used and adapted to the new detection process. The covariance-based estimator (CVE) seems to be the best way to evaluate the diffusion coefficient from trajectories using the specific factors of motion blur and localization error.

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