Chimica Techno Acta (Mar 2015)

Physicochemical conditions of GaAs/GaAsxNy/GaN nanochips stability

  • N. V. Komarovskih,
  • L. V. Fomina,
  • S. A. Beznosyuk

DOI
https://doi.org/10.15826/chimtech.2015.2.1.008
Journal volume & issue
Vol. 2, no. 1
pp. 78 – 87

Abstract

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In this work the study of the stability nanochips GaAs / GaAsxNy / GaN is presented. For the calculation of parameters used quantum-chemical and thermodynamic approaches. The calculations of the surface free energy nanochips within the models used show that a significant contribution to the crystalline structure stability of the GaN layer is the molar concentration of nitrogen atoms in the intermediate layer GaAsxNy nanochips GaAs / GaAsxNy / GaN.

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