Active and Passive Electronic Components (Jan 1983)

Experimental and Theoretical Characterization of Thick and Thin Films for Microwave Uses on 99.6% Alumina Substrates

C. Thebault,
R. Schnitzler,
J. P. Ramy

Affiliations

C. Thebault
R. Schnitzler
J. P. Ramy

DOI: https://doi.org/10.1155/APEC.10.157
Journal volume & issue: Vol. 10, no. 2-3
pp. 157 – 162

Abstract

No abstracts available.

Published in Active and Passive Electronic Components

ISSN: 0882-7516 (Print); 1563-5031 (Online)
Publisher: Wiley
Country of publisher: United Kingdom
LCC subjects: Technology: Electrical engineering. Electronics. Nuclear engineering
Website: https://onlinelibrary.wiley.com/journal/5080

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