Editorial: Advanced characterization methods for HfO2/ZrO2-based ferroelectrics

• Patrick D. Lomenzo,
• Umberto Celano,
• Umberto Celano,
• Thomas Kämpfe,
• Sean R. C. McMitchell

Affiliations

Patrick D. Lomenzo

Nanoelectronic Materials Laboratory (NaMLab) gGmbH, Dresden, Germany

Umberto Celano

Interuniversity Microelectronics Center (IMEC), Leuven, Belgium

Umberto Celano

School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ, United States

Thomas Kämpfe

Fraunhofer IPMS, Center Nanoelectronic Technologies, Dresden, Germany

Sean R. C. McMitchell

Interuniversity Microelectronics Center (IMEC), Leuven, Belgium