Frontiers in Nanotechnology (Jan 2023)

Editorial: Advanced characterization methods for HfO2/ZrO2-based ferroelectrics

  • Patrick D. Lomenzo,
  • Umberto Celano,
  • Umberto Celano,
  • Thomas Kämpfe,
  • Sean R. C. McMitchell

DOI
https://doi.org/10.3389/fnano.2023.1114267
Journal volume & issue
Vol. 5

Abstract

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No abstracts available.

Keywords