Journal of Advanced Dielectrics (Apr 2017)

Preparation of 0.055BaZrO3–0.935(K0.45Na0.5Li0.05)NbO3–0.01(Bi0.5Na0.5)TiO3 piezoelectric thin films from precursor solution by Pechini method

  • Liqiang Liu,
  • Tomoaki Karaki,
  • Tadashi Fujii,
  • Yuichi Sakai

DOI
https://doi.org/10.1142/S2010135X1750014X
Journal volume & issue
Vol. 7, no. 2
pp. 1750014-1 – 1750014-4

Abstract

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Lead-free piezoelectric thin films of 0.055BaZrO3–0.935(K0.45Na0.5Li0.05)NbO3–0.01(Bi0.5Na0.5)TiO3 (BZ–KNLN–BNT) were fabricated on (100)-LaNiO3/SiO2/Si substrates. The Pechini (polymeric precursor) method was carried out to prepare the complicated multi-component precursor solution. This method was suited for controlling the complex components accurately. The films crystallized at 700∘C showed a (100)pc-oriented perovskite structure, whose grain size was about 200nm and thickness was about 700nm. The Curie temperature Tc of the films was 292∘C that was near to that of the bulk ceramics. The preparation method used in this work provided a possibility for the application of multi-component lead-free piezoelectric films.

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