Influence of the Substrate on the Exchange Coupling of NiO/FeCo Bilayers

Abstract

Antiferromagnetic/ferromagnetic (AF/F) systems have been extensively investigated due to the importance that interfacial exchange coupling effects have in the development of magnetic storage technologies. Recently, these systems have garnered interest for the potential they have to imprint the magnetic moments of the AF into an F layer, offering the possibility of using it as a read-out mechanism in antiferromagnetic spintronics. In this study, we explored the importance of crystalline orientation and strains induced by the substrate in the exchange coupling properties of NiO/FeCo AF/F bilayers. For that, we have grown NiO/FeCo bilayers on MgO (001) and Al2O3 (0001) substrates varying the FeCo layer thickness. In addition, we have analyzed both deposited samples and those with induced interfacial unidirectional anisotropy. For inducing such interfacial anisotropy, we used a field cooling procedure, heating the bilayers to 650 K and subsequently cooling down to room temperature under the presence of an external magnetic field of 300 mT. We have investigated the effect of the substrate in terms of crystalline orientation and lattice mismatching on the AF/F exchange coupling as well as the dependence of the coercivity and exchange bias on the inverse F layer thickness that is consistent with the interfacial origin of the AF/F exchange coupling. Moreover, the angular dependence of the magnetic properties was explored by using vectorial Kerr magnetometry, confirming the presence of both magnetocrystalline anisotropy, arising from the epitaxial character of the growing process mainly when the bilayer is grown on MgO (001) substrates, and the field cooling (FC)-induced unidirectional anisotropy.

Keywords

• antiferromagnetic
• exchange-coupling
• NiO
• epitaxial films