The Journal of Engineering (Jun 2016)

GaN High Electron Mobility Transistors: A Review from Parasitic Elements Extraction Perspective

Anwar Jarndal,
Ammar Kouki

Affiliations

Anwar Jarndal
Ammar Kouki

DOI: https://doi.org/10.1049/joe.2016.0161

Abstract

No abstracts available.

Published in The Journal of Engineering

ISSN: 2051-3305 (Online)
Publisher: Wiley
Country of publisher: United Kingdom
LCC subjects: Technology: Engineering (General). Civil engineering (General)
Website: https://ietresearch.onlinelibrary.wiley.com/journal/20513305

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