Applied Sciences (Aug 2021)

Analysis of Transient Degradation Behaviors of Organic Light-Emitting Diodes under Electrical Stress

  • Gyeong Won Lee,
  • Yoonsuk Choi,
  • Heejin Kim,
  • Jongwoo Park,
  • Jong-In Shim,
  • Dong-Soo Shin

DOI
https://doi.org/10.3390/app11167627
Journal volume & issue
Vol. 11, no. 16
p. 7627

Abstract

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Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.

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