Physical Review Accelerators and Beams (Aug 2018)

X-ray Hanbury Brown-Twiss interferometry for determination of ultrashort electron-bunch duration

  • Ichiro Inoue,
  • Toru Hara,
  • Yuichi Inubushi,
  • Kensuke Tono,
  • Takahiro Inagaki,
  • Tetsuo Katayama,
  • Yoshiyuki Amemiya,
  • Hitoshi Tanaka,
  • Makina Yabashi

DOI
https://doi.org/10.1103/PhysRevAccelBeams.21.080704
Journal volume & issue
Vol. 21, no. 8
p. 080704

Abstract

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An x-ray Hanbury Brown-Twiss interferometry to diagnose a temporal profile of a femtosecond electron bunch (e-bunch) is presented. We show that intensity interference of spontaneous x-ray radiation from the e-bunch reflects the e-bunch profile. Based on this relationship, a temporal profile of the 8.1-GeV e-bunch at SPring-8 Angstrom Compact free-electron LAser (SACLA) that generates x-ray free-electron laser (XFEL) light is characterized through the intensity interference measurement. Combining this e-bunch profile with a numerical simulation, the XFEL pulse duration generated by the e-bunch is estimated to be less than 10 fs.