Focused Ion Beam-Prepared Transmission Electron Microscopy Examination of Atmospheric Chemical Vapor-Infiltrated Silicon Carbide Morphology

• Zachary Tobin,
• Kenneth Petroski,
• Peter Kerns,
• Amjad Almansour,
• Joseph Grady,
• Steven L. Suib

Affiliations

Zachary Tobin

Department of Chemistry, University of Connecticut, Storrs, Connecticut, United States

Kenneth Petroski

Department of Chemistry, University of Connecticut, Storrs, Connecticut, United States

Peter Kerns

Department of Chemistry, University of Connecticut, Storrs, Connecticut, United States

Amjad Almansour

NASA Glenn Research Center, Cleveland, Ohio, United States

Joseph Grady

NASA Glenn Research Center, Cleveland, Ohio, United States

Steven L. Suib

Department of Chemistry, University of Connecticut, Storrs, Connecticut, United States