Three-dimensional in situ imaging of single-grain growth in polycrystalline In2O3:Zr films

Abstract

Understanding grain morphology and kinetics of solid-phase crystallization is important for controlling the functional properties of polycrystalline materials. Here, in situ coherent X-ray diffraction imaging and transmission electron microscopy elucidate quantitatively the kinetics of a single-grain growth in Zr-doped In2O3 films.